How Are Statistics Applied to SMT Stencil Print Quality?
We often get asked for details on how to and what are best practices for applying statistics to print quality? In this technical bulletin we will cover how you can apply statistics to evaluate the performance of your SMT stencil process.
Technical Bulletin Series
Statistical SMT Stencil Print Metrics
- Cp - Process Capability Index - relates process variation to specification limits
- Cpk - Process Capability Index - relates process variation to specification limits AND process centering between the limits
- CV - Coefficient of Variation - relates variation to average and removes spec limits from the equation
Each metric uses σ (sigma, the standard deviation, to describe the spread of the data. Each metric uses σ in different ways.
Follow us on LinkedIn to stay up to date on all the most recent NanoClear developments at Aculon including: technology updates, cleaning & treatment tips, case studies, troubleshooting tips, and application ideas.
